Characterization of cell mismatch in photovoltaic modules using electroluminescence and associated electro-optic techniques
- Authors: Crozier, Jacqueline Louise
- Date: 2012
- Subjects: Photovoltaic cells , Solar cells
- Language: English
- Type: Thesis , Masters , MSc
- Identifier: vital:10545 , http://hdl.handle.net/10948/d1015059
- Description: Solar cells allow the energy from the sun to be converted into electrical energy; this makes solar energy much more environmentally friendly than fossil fuel energy sources. These solar cells are connected together in a photovoltaic (PV) module to provide the higher current, voltage and power outputs necessary for electrical applications. However, the performance of the PV module is limited by the performance of the individual cells. Cell mismatch occurs when some cells are damaged or shaded and produce lower current output than the other cells in the series connected string. The cell mismatch lowers the module performance and can result in further damage as the weak cells are reverse biased and dissipate heat. Bypass diodes can be connected into the module to increase the module current output and prevent further damage. Since cell mismatch results in a significant decrease in the performance of deployed modules it is important to fully understand and characterise its effect on PV modules. PV modules can be characterised using various techniques, each providing important information about the performance of the module. Most commonly the current-voltage (I-V) characteristic curve of a module is measured in outdoor, fully illuminated conditions. This allows performance parameters such as short circuit current (Isc), open circuit voltage (Voc) and maximum power (Pmax) to be determined. In addition to this the shape of the curve allows device parameters like series and shunt resistances to be determined using parameter extraction algorithms like Particle Swarm Optimisation (PSO). The extracted parameters can be entered into the diode equation to model the I-V curve of the module. The I-V characteristic of the module can also be used to identify poor current producing cells in the module by using the worst-case cell determination method. In this technique a cell is shaded and the greater the drop in current in the whole module the better the current production of the shaded cell. The photoresponse of cells in a module can be determined by the Large-area Light Beam Induced Current (LA-LBIC) technique which involves scanning a module with a laser beam and recording the current generated. Electroluminescence (EL) is emitted by a forward biased PV module and is used to identify defects in cell material. Defects such as cracks and broken fingers can be detected as well as material features such as grain boundaries. These techniques are used to in conjunction to characterise the modules used in this study. The modules investigated in this study each exhibit cell mismatch resulting from different causes. Each module is characterised using a combination of characterisation techniques which allows the effect of cell mismatch be investigated. EL imaging enabled cracks and defects, invisible to the naked eye, to be detected allowing the reduced performance observed in I-V curves to be explained. It was seen that the cracked cells have a significant effect on the current produced by a string, while the effect of delaminated areas is less severe. Hot spots are observed on weak cells indicating they are in reverse bias conditions and will degrade further with time. PSO parameter extraction from I-V curves revealed that the effect of module degradation of device parameters like series and shunt resistances. A module with cracked cells and degradation of the antireflective coating has low shunt resistance indicating current losses due to shunting. Similar shunting is observed in a module with delamination and moisture ingress. The extracted parameters are used to simulate the I-V curves of modules with reasonable fit. The fit could be improved around the “knee” of the I-V curve by improving the methods of parameter extraction. This study has shown the effects of cell mismatch on the performance and I-V curves of the PV modules. The different causes of cell mismatch are discussed and modules with different cell configuration and damage are characterised. The characterisation techniques used on each module provide information about the photoresponse, current generation, material properties and cell defects. A comprehensive understanding of these techniques allows the cell mismatch in the modules to be fully characterized.
- Full Text:
- Date Issued: 2012
- Authors: Crozier, Jacqueline Louise
- Date: 2012
- Subjects: Photovoltaic cells , Solar cells
- Language: English
- Type: Thesis , Masters , MSc
- Identifier: vital:10545 , http://hdl.handle.net/10948/d1015059
- Description: Solar cells allow the energy from the sun to be converted into electrical energy; this makes solar energy much more environmentally friendly than fossil fuel energy sources. These solar cells are connected together in a photovoltaic (PV) module to provide the higher current, voltage and power outputs necessary for electrical applications. However, the performance of the PV module is limited by the performance of the individual cells. Cell mismatch occurs when some cells are damaged or shaded and produce lower current output than the other cells in the series connected string. The cell mismatch lowers the module performance and can result in further damage as the weak cells are reverse biased and dissipate heat. Bypass diodes can be connected into the module to increase the module current output and prevent further damage. Since cell mismatch results in a significant decrease in the performance of deployed modules it is important to fully understand and characterise its effect on PV modules. PV modules can be characterised using various techniques, each providing important information about the performance of the module. Most commonly the current-voltage (I-V) characteristic curve of a module is measured in outdoor, fully illuminated conditions. This allows performance parameters such as short circuit current (Isc), open circuit voltage (Voc) and maximum power (Pmax) to be determined. In addition to this the shape of the curve allows device parameters like series and shunt resistances to be determined using parameter extraction algorithms like Particle Swarm Optimisation (PSO). The extracted parameters can be entered into the diode equation to model the I-V curve of the module. The I-V characteristic of the module can also be used to identify poor current producing cells in the module by using the worst-case cell determination method. In this technique a cell is shaded and the greater the drop in current in the whole module the better the current production of the shaded cell. The photoresponse of cells in a module can be determined by the Large-area Light Beam Induced Current (LA-LBIC) technique which involves scanning a module with a laser beam and recording the current generated. Electroluminescence (EL) is emitted by a forward biased PV module and is used to identify defects in cell material. Defects such as cracks and broken fingers can be detected as well as material features such as grain boundaries. These techniques are used to in conjunction to characterise the modules used in this study. The modules investigated in this study each exhibit cell mismatch resulting from different causes. Each module is characterised using a combination of characterisation techniques which allows the effect of cell mismatch be investigated. EL imaging enabled cracks and defects, invisible to the naked eye, to be detected allowing the reduced performance observed in I-V curves to be explained. It was seen that the cracked cells have a significant effect on the current produced by a string, while the effect of delaminated areas is less severe. Hot spots are observed on weak cells indicating they are in reverse bias conditions and will degrade further with time. PSO parameter extraction from I-V curves revealed that the effect of module degradation of device parameters like series and shunt resistances. A module with cracked cells and degradation of the antireflective coating has low shunt resistance indicating current losses due to shunting. Similar shunting is observed in a module with delamination and moisture ingress. The extracted parameters are used to simulate the I-V curves of modules with reasonable fit. The fit could be improved around the “knee” of the I-V curve by improving the methods of parameter extraction. This study has shown the effects of cell mismatch on the performance and I-V curves of the PV modules. The different causes of cell mismatch are discussed and modules with different cell configuration and damage are characterised. The characterisation techniques used on each module provide information about the photoresponse, current generation, material properties and cell defects. A comprehensive understanding of these techniques allows the cell mismatch in the modules to be fully characterized.
- Full Text:
- Date Issued: 2012
Investigation of device and performance parameters of photovoltaic devices
- Macabebe, Erees Queen Barrido
- Authors: Macabebe, Erees Queen Barrido
- Date: 2009
- Subjects: Photovoltaic cells , Solar cells , Photovoltaic power systems , Photovoltaic power generation
- Language: English
- Type: Thesis , Doctoral , PhD
- Identifier: vital:10538 , http://hdl.handle.net/10948/1003 , http://hdl.handle.net/10948/d1012890 , Photovoltaic cells , Solar cells , Photovoltaic power systems , Photovoltaic power generation
- Description: In order to investigate the influence of parasitic resistances, saturation current and diode ideality factor on the performance of photovoltaic devices, parameter extraction routines employing the standard iteration (SI) method and the particle swarm optimization (PSO) method were developed to extract the series resistance, shunt resistance, saturation current and ideality factor from the I-V characteristics of solar cells and PV modules. The well-known one- and two-diode models were used to describe the behavior of the I-V curve and the parameters of the models were determined by approximation and iteration techniques. The SI and the PSO extraction programmes were used to assess the suitability of the one- and the two-diode solar cell models in describing the I-V characteristics of mono- and multicrystalline silicon solar cells, CISS- and CIGSS-based solar cells. This exercise revealed that the two-diode model provides more information regarding the different processes involved in solar cell operation. Between the two methods developed, the PSO method is faster, yielded fitted curves with lower standard deviation of residuals and, therefore, was the preferred extraction method. The PSO method was then used to extract the device parameters of CISS-based solar cells with the CISS layer selenized under different selenization process conditions and CIGSS-based solar cells with varying i-ZnO layer thickness. For the CISS-based solar cells, the detrimental effect of parasitic resistances on device performance increased when the temperature and duration of the selenization process was increased. For the CIGSS-based devices, photogeneration improved with increasing i-ZnO layer thickness. At high forward bias, bulk recombination and/or tunneling-assisted recombination were the dominant processes affecting the I-V characteristics of the devices. v Lastly, device and performance parameters of mono-, multicrystalline silicon and CIS modules derived from I-V characteristics obtained under dark and illuminated conditions were analyzed considering the effects of temperature on the performance of the devices. Results showed that the effects of parasitic resistances are greater under illumination and, under outdoor conditions, the values further declined due to increasing temperature. The saturation current and ideality factor also increased under outdoor conditions which suggest increased recombination and, coupled with the adverse effects of parasitic resistances, these factors result in lower FF and lower maximum power point. Analysis performed on crystalline silicon and thin film devices utilized in this study revealed that parameter extraction from I-V characteristics of photovoltaic devices and, in particular, the implementation of PSO in solar cell device parameter extraction developed in this work is a useful characterization technique.
- Full Text:
- Date Issued: 2009
- Authors: Macabebe, Erees Queen Barrido
- Date: 2009
- Subjects: Photovoltaic cells , Solar cells , Photovoltaic power systems , Photovoltaic power generation
- Language: English
- Type: Thesis , Doctoral , PhD
- Identifier: vital:10538 , http://hdl.handle.net/10948/1003 , http://hdl.handle.net/10948/d1012890 , Photovoltaic cells , Solar cells , Photovoltaic power systems , Photovoltaic power generation
- Description: In order to investigate the influence of parasitic resistances, saturation current and diode ideality factor on the performance of photovoltaic devices, parameter extraction routines employing the standard iteration (SI) method and the particle swarm optimization (PSO) method were developed to extract the series resistance, shunt resistance, saturation current and ideality factor from the I-V characteristics of solar cells and PV modules. The well-known one- and two-diode models were used to describe the behavior of the I-V curve and the parameters of the models were determined by approximation and iteration techniques. The SI and the PSO extraction programmes were used to assess the suitability of the one- and the two-diode solar cell models in describing the I-V characteristics of mono- and multicrystalline silicon solar cells, CISS- and CIGSS-based solar cells. This exercise revealed that the two-diode model provides more information regarding the different processes involved in solar cell operation. Between the two methods developed, the PSO method is faster, yielded fitted curves with lower standard deviation of residuals and, therefore, was the preferred extraction method. The PSO method was then used to extract the device parameters of CISS-based solar cells with the CISS layer selenized under different selenization process conditions and CIGSS-based solar cells with varying i-ZnO layer thickness. For the CISS-based solar cells, the detrimental effect of parasitic resistances on device performance increased when the temperature and duration of the selenization process was increased. For the CIGSS-based devices, photogeneration improved with increasing i-ZnO layer thickness. At high forward bias, bulk recombination and/or tunneling-assisted recombination were the dominant processes affecting the I-V characteristics of the devices. v Lastly, device and performance parameters of mono-, multicrystalline silicon and CIS modules derived from I-V characteristics obtained under dark and illuminated conditions were analyzed considering the effects of temperature on the performance of the devices. Results showed that the effects of parasitic resistances are greater under illumination and, under outdoor conditions, the values further declined due to increasing temperature. The saturation current and ideality factor also increased under outdoor conditions which suggest increased recombination and, coupled with the adverse effects of parasitic resistances, these factors result in lower FF and lower maximum power point. Analysis performed on crystalline silicon and thin film devices utilized in this study revealed that parameter extraction from I-V characteristics of photovoltaic devices and, in particular, the implementation of PSO in solar cell device parameter extraction developed in this work is a useful characterization technique.
- Full Text:
- Date Issued: 2009
On the characterization of photovoltaic devices for concentrator purposes
- Authors: Vorster, Frederick Jacobus
- Date: 2007
- Subjects: Photovoltaic cells , Image processing , Solar cells
- Language: English
- Type: Thesis , Doctoral , PhD
- Identifier: vital:10530 , http://hdl.handle.net/10948/639 , Photovoltaic cells , Image processing , Solar cells
- Description: This study originated from an evaluation of the performance of a commercially available high concentration point focus concentrator PV system. The effect of module design flaws was studied by using current-voltage (I-V) curves obtained from each module in the array. The position of reverse bias steps revealed the severity of mismatch in a string of series-connected cells. By understanding the effects of the various types of mismatch, power losses and damage to the solar cells resulting from hot spot formation can be minimized and several recommendations for improving the basic performance of similar systems were made. Concern over the extent and type of defect failure of the concentrator photovoltaic (CPV) cells prompted an investigation into the use of a light beam induced current (LBIC) technique to investigate the spatial distribution of defects. An overview of current and developing LBIC techniques revealed that the original standard LBIC techniques have found widespread application, and that far-reaching and important developments of the technique have taken place over the years. These developments are driven by natural progression as well as the availability of newly developed advanced measurement equipment. Several techniques such as Lock-in hermography and the use of infrared cameras have developed as complementary techniques to advanced LBIC techniques. As an accurate contactless evaluation tool that is able to image spatially distributed defects in cell material, the basis of this method seemed promising for the evaluation of concentrator cells.
- Full Text:
- Date Issued: 2007
- Authors: Vorster, Frederick Jacobus
- Date: 2007
- Subjects: Photovoltaic cells , Image processing , Solar cells
- Language: English
- Type: Thesis , Doctoral , PhD
- Identifier: vital:10530 , http://hdl.handle.net/10948/639 , Photovoltaic cells , Image processing , Solar cells
- Description: This study originated from an evaluation of the performance of a commercially available high concentration point focus concentrator PV system. The effect of module design flaws was studied by using current-voltage (I-V) curves obtained from each module in the array. The position of reverse bias steps revealed the severity of mismatch in a string of series-connected cells. By understanding the effects of the various types of mismatch, power losses and damage to the solar cells resulting from hot spot formation can be minimized and several recommendations for improving the basic performance of similar systems were made. Concern over the extent and type of defect failure of the concentrator photovoltaic (CPV) cells prompted an investigation into the use of a light beam induced current (LBIC) technique to investigate the spatial distribution of defects. An overview of current and developing LBIC techniques revealed that the original standard LBIC techniques have found widespread application, and that far-reaching and important developments of the technique have taken place over the years. These developments are driven by natural progression as well as the availability of newly developed advanced measurement equipment. Several techniques such as Lock-in hermography and the use of infrared cameras have developed as complementary techniques to advanced LBIC techniques. As an accurate contactless evaluation tool that is able to image spatially distributed defects in cell material, the basis of this method seemed promising for the evaluation of concentrator cells.
- Full Text:
- Date Issued: 2007
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